James, Benjamin; Tran, Linh T.; Bolst, David; Perrachi, Stefania; Davis, Jeremy; Prokopovich, Dale A.; Guatelli, Susanna; Petasecca, Marco; Lerch, Michael L.F.; Povoli, Marco; Kok, Angela; Goethem, Marc-Jan; Nancarrow, Mitchell; Matsufuji, Naruhiro; Jackson, Michael; Rosenfeld, Anatoly B. (Journal article; Peer reviewed, 2019)
The response of a 5 μm thin silicon on insulator (SOI) 3D microdosimeter was investigated for single event upset applications by measuring the LET of different high LET ions. The charge collection characteristics of the ...